30th April to 4th May 2017 in Kasteel Vaalsbroek, NetherlandsRegistration Deadline: 27.1.2017
The Fourth Conference on Frontiers of Aberration Corrected Electron Microscopy – PICO 2017 – will be held from 30 April to 4 May 2017 in Kasteel Vaalsbroek. The meeting will address recent advances in methods and applications for the study of structural and electronic properties of solids by the application of advanced transmission electron microscopy techniques in materials science.
PICO 2017 is scheduled to take place again in Kasteel Vaalsbroek located at the bordering point of The Netherlands, Germany and Belgium. Topical issues of advanced electron microscopy research will be highlighted in 44 keynote presentations given by leading invited speakers plus further poster presentations from the wider scientific community.
This workshop brings together key scientific players who are likely to deepen the understanding of materials science, computational physics and chemistry as well as machine learning.
Time: Wednesday-Thursday, 8-9 March, 2017
Place: Otakaari 1 (TBC), Aalto University, Finland